Non Contact Atomic Force Microscope Electrical Manipulation of Carbon Nanotubes and Its Application to Fabrication of a Room Temperature Operating Single Electron Transistor
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概要
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We demonstrate that a non-contact atomic force microscope (AFM) can be used to cut and nick carbon nanotubes (CNTs) by applying negative bias to the metal-coated AFM tip when it is very close to the CNT. The voltage needed to cut the CNT completely varied from $-8$ to $-15$ V, while the nicking voltage ranged from $-6$ to $-8$ V. This technique was applied to make a nanoscale single CNT device. Unwanted CNTs were cut first to leave only one CNT connecting the electrodes. Finally, tunneling barriers defined by two small nicks were created on the CNT to fabricate a single electron transistor. The final device shows Coulomb oscillation and Coulomb diamond characteristics at room temperature.
- 2005-04-15
著者
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Kamimura Takafumi
National Institute Of Advanced Industrial Science And Technology
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HYON Chan
National Institute of Advanced Industrial Science and Technology
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KOJIMA Atsuhiko
National Institute of Advanced Industrial Science and Technology
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MAEDA Masatoshi
CREST/JST
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Matsumoto Kazuhiko
National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn
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Matsumoto Kazuhiko
National Institute of Advanced Industrial Science and Technology, Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Kamimura Takafumi
National Institute of Advanced Industrial Science and Technology, Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Hyon Chan
National Institute of Advanced Industrial Science and Technology, Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Maeda Masatoshi
CREST, Japan Science and Technology Agency, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan
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Maeda Masatoshi
CREST/JST, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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