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NTT LSI laboratories | 論文
- Effect of Si/SiO_2 Interface on Silicon and Boron Diffusion in Thermally Grown SiO_2
- Mechanism of Potential Profile Formation in Silicon Single-Electron Transistors Fabricated Using Pattern-Dependent Oxidation : Semiconductors
- Single-Electron Transistor and Current-Switching Device Fabricated by Vertical Pattern-Dependent Oxidation
- Effect of Oxidation-Induced Strain on Potential Profile in Si SETs Using Pattern-Dependent Oxidation (PADOX)
- Fabrication of SiO_2/Si/SiO_2 Double Barrier Diodes using Two-Dimensional Si Structures
- Electron Tunneling from a Quantum Wire Formed at the Edge of a SIMOX-Si Layer
- Energy Eigenvalues and Quantized Conductance Values of Electrons in Si Quantum Wires on {100} Plane
- Fabrication and Electrical Characteristics of Silicon Quantum Dot Devices
- Novel Fabrication Technique for a Si Single-Electron Transistor and Its High Temperature Operation
- Thermal Agglomeration of Thin Single Crystal Si on SiO_2 in Vacuum
- 色素増感太陽電池の等価回路解析
- 色素増感太陽電池の等価回路解析(有機エレクトロニクス・一般)
- Single-Board SIMD Processors Using Gate-Array LSIs for Parallel Processing (Special Issue on ASICs for Automotive Electronics)
- Stress dependence of oxidation reaction at SiO2/Si interfaces during silicon thermal oxidation
- Microscopic Mechanism of Oxygen Transport during Thermal Silicon Oxidation
- Theoretical Investigation of Oxygen Diffusion in Compressively Strained High-Density α-Quartz
- First-Principles Analyses of O_2 Molecules around Ultrathin SiO_2/Si(100) Interface
- Oxygen Trap Hypothesis in Silicon Oxide
- Theoretical Study of Excess Si Emitted from Si-oxide/Si Interfaces
- TiN Thin Film Prepared by Chermical Vapor Deposition Method Using Cp_2Ti(N_3)_2