スポンサーリンク
Graduate School of Advanced Science of Matter Hiroshima University | 論文
- Circuit-Simulation Model of C_ Changes in Small-Size MOSFETs Due to High Channel-Field Gradients(the IEEE International Conference on SISPAD '02)
- Shot noise modeling in metal-oxide-semiconductor field effect transistors under sub-threshold Condition
- Experimental Study of Temperatures of Atmospheric-Pressure Nonequilibrium Ar/N_2 Plasma Jets and Poly(ethylene terephtalate)-Surface Processing
- Consideration of the Effect of the Nonspherical Distribution of Electrons in Atomic Structures
- MOSFET Harmonic Distortion up to the Cutoff Frequency : Measurement and Theoretical Analysis
- Analysis of Chemical Structures of Ulthathin Oxynitride Films by X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry
- Corrosion Prevention of Pure Iron Using Self-Assembled Monolayer Coating
- Simple Method of Synthesizing Nickel--Nitrilotriacetic Acid Gold Nanoparticles with a Narrow Size Distribution for Protein Labeling
- Implementation of the Bloch Operator Method for Solving the Poisson Equation
- Solution of the Poisson Equation with Coulomb Singularities
- Thickness Dependences of Nucleation and Annihilation Fields of Magnetic Vortices in Submicron Supermalloy Dots
- Highly Adhesive Electroless Cu Layer Formation Using an Ultra Thin Ionized Cluster Beam (ICB)-Pd Catalytic Layer for Sub-100 nm Cu Interconnections
- Climbing Rates of Microtubules Propelled by Dynein after Collision with Microfabricated Walls
- A Self-Consistent Non-Quasi-Static MOSFET Model for Circuit Simulation Based on Transient Carrier Response
- Influence of Surface Oxide of Sputtered TaN on Displacement Plating of Cu
- Surface-Potential-Based Metal–Oxide–Silicon-Varactor Model for RF Applications
- Computer-Aided Chemistry Estimation Method of Electronic-Polarization Dielectric Constants for the Molecular Design of Low-$k$ Materials
- Contact Resistance Reduction Using Vacuum Loadlock System and Plasma Dry Cleaning
- Mobility and Number Fluctuations in MOS Structures
- Low-Frequency Noise Generated from High-Field Region in AlGaAs/InGaAs HEMTs