Takemura Riichiro | Central Research Laboratory Hitachi Ltd.
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概要
関連著者
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Takemura Riichiro
Central Research Laboratory Hitachi Ltd.
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TAKEMURA Riichiro
Central Research Laboratory, Hitachi, Ltd.
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Itoh Kiyoo
Central Research Lab. Hitachi Ltd.
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Kotabe Akira
Central Research Laboratory Hitachi Ltd.
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Itoh Kiyoo
Hitachi Ltd. Kokubunji‐shi Jpn
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Sekiguchi Tomonori
Hitachi Europe Ltd.
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Akiyama Satoru
Central Research Laboratory Hitachi Ltd.
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KOTABE Akira
Central Research Laboratory, Hitachi, Ltd.
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SEKIGUCHI Tomonori
Central Research Laboratory, Hitachi, Ltd.
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Kawahara Takayuki
Central Research Laboratory Hitachi Ltd.
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AKIYAMA Satoru
Central Research Laboratory, Hitachi, Ltd.
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Takaura Norikatsu
Central Research Laboratory Hitachi. Ltd.
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Sekiguchi Tomonori
Central Research Laboratory Hitachi Ltd.
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Yanagawa Yoshimitsu
Central Research Laboratory Hitachi Ltd.
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Ono Kazuo
Central Research Laboratory Hitachi Ltd.
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Sakata Takeshi
Central Research Laboratory Hitachi Ltd.
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Sakata Takeshi
Central Research Lab. Hitachi Ltd.
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Nakagawa Tatsuo
Central Research Laboratory Hitachi Ltd.
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Terao Motoyasu
Central Resarch Laboratory Hitachi Ltd.
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Fujisawa Hiroki
The Development Div. Elpida Memory Inc.
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ITOH Kiyoo
Central Research Laboratory, Hitachi, Ltd.
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HANZAWA Satoru
Central Research Laboratory, Hitachi, Ltd.
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KAJIGAYA Kazuhiko
ELPIDA Memory, Inc.
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Hanzawa Satoru
Central Research Laboratory Hitachi Ltd.
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NAGAI Ryo
Advanced Device Development Gr., Elpida Memory, Inc.
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YAMADA Satoru
Advanced Device Development Gr., Elpida Memory, Inc.
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ASAKURA Hisao
Information & Control Systems Division, Computer Systems Quality Assurance Section, Hitachi, Ltd.
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Sakata T
Hitachi Ltd. Kokubunji‐shi Jpn
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Matsuoka Hideyuki
Central Research Laboratory Hitachi Ltd.
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FUJISAWA Hiroki
Elpida Memory, Inc.
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TAKAHASHI Tsugio
Elpida Memory, Inc.
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NAKAMURA Masayuki
Elpida Memory, Inc.
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Takahashi Tsugio
Elpida Memory Inc.
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Fujisaki Yoshihisa
Central Research Laboratory Hitachi Limited
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Sekiguchi T
Central Research Laboratory Hitachi Ltd.
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Kajigaya Kazuhiko
Elpida Memory Inc.
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Nakamura Masayuki
Elpida Memory Inc.
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Iwasaki Tomio
Hitachi Res. Lab. Hitachi Ltd.
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Iwasaki Tomio
Hitachi Research Laboratory Hitachi Ltd.
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Matsuoka Hideyuki
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Nagai Ryo
Advanced Device Development Gr., Elpida Memory, Inc. 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
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Takemura Riichiro
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Takemura Riichiro
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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TAKEMURA Riichiro
Central Research Laboratory, Hitachi Ltd.
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Terao Motoyasu
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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Kurotsuchi Kenzo
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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Asakura Hisao
Information & Control Systems Division, Computer Systems Quality Assurance Section, Hitachi, Ltd., Hitachi System Plaza Shinkawasaki, 890 Komukai Kashimada, Saiwai, Kawasaki, Kanagawa 212-8567, Japan
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Yamada Satoru
Advanced Device Development Gr., Elpida Memory, Inc. 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan
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Ono Kazuo
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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Takaura Norikatsu
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japan
著作論文
- Long-Retention-Time, High-Speed DRAM Array with 12-F^2 Twin Cell for Sub 1-V Operation(Memory,Low-Power, High-Speed LSIs and Related Technologies)
- An Independent-Source Overdriven Sense Amplifier for Multi-Gigabit DRAM Array
- Resistive Switching Ion-Plug Memory for 32-nm Technology Node and Beyond
- Eliminating the Threshold-Voltage Offset of p-Channel Metal-Oxide-Semiconductor Field Effect Transistors in High-Density Dynamic Random Access Memory
- A Low-Vt Small-Offset Gated-Preamplifier for Sub-1-V DRAM Mid-Point Sensing
- 0.5-V 25-nm 6-T Cell with Boosted Word Voltage for 1-Gb SRAMs
- A Low-V_t Small-Offset Gated-Preamplifier for Sub-1-V DRAM Mid-Point Sensing
- Small-Sized Leakage-Controlled Gated Sense Amplifier for 0.5-V Multi-Gigabit DRAM Arrays
- Fluctuation Tolerant Charge-Integration Read Scheme for Ultrafast DNA Sequencing with Nanopore Device