Chiou B‐s | Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

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概要

• 同名の論文著者
• Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung Universityの論文著者

関連著者

• Chiou B‐s

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• CHIOU Bi-Shiou

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University

• Sun Jack

  Taiwan Semiconductor Manufacturing Co. R&d

• Lee K‐h

  Taiwan Semiconductor Manufacturing Co. R&d

• Lee Kuo-hua

  Taiwan Semiconductor Manufacturing Co. R&d

• SU Hung-Der

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University

• CHANG Ming-Hsung

  Taiwan Semiconductor Manufacturing Co., R&D

• CHAO Chih-Ping

  Taiwan Semiconductor Manufacturing Co., R&D

• Chiou Bi-shiou

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Wu Shien-Yang

  Taiwan Semiconductor Manufacturuing Company

• Wu Wen-fa

  National Nano Device Laboratories

• CHEN Yung-Shun

  Taiwan Semiconductor Manufacturing Co., R&D

• SEE Yee-Chaung

  Taiwan Semiconductor Manufacturing Co., R&D

• Wu Shien-yang

  Taiwan Semiconductor Manufacturing Co. R&d

• Chin Y‐l

  National Chiao Tung Univ. Hsinchu Twn

• CHIN Yu-Lung

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University,

• Chin Yu-lung

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• KO Chin-Yuan

  Taiwan Semiconductor Manufacturing Co., RA

• LU Ping-Chiang

  Taiwan Semiconductor Manufacturing Co., R&D

• SEE Yee-Chanung

  Taiwan Semiconductor Manufacturing Co., R&D

• YANG Tzong-Jer

  Department of Electrophysics, National Chiao Tung University

• Su Hung-der

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Lu Ping-chiang

  Taiwan Semiconductor Manufacturing Co. R&d

• See Yee-chanung

  Taiwan Semiconductor Manufacturing Co. R&d

• Yang Tzong-jer

  Department Of Electro-physics National Chiao-tung University

• Chao Chih-ping

  Taiwan Semiconductor Manufacturing Co. R&d

• LEE Win-Der

  Institute of Electronics, National Chiao-Tung University

• CHIOU Bi-Shiou

  Institute of Electronics, National Chiao-Tung University

• Lee Win-der

  Institute Of Electronics National Chiao-tung University

• Chang Ming-hsung

  Taiwan Semiconductor Manufacturing Co. R&d

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著作論文

• Bi-Mode Breakdown Test Methodology of Ultrathin Oxide
• Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide
• Novel Chip Standby Current Prediction Model and Ultrathin Gate Oxide Scaling Limit(Semiconductors)
• Effect of the Tantalum Barrier Layer on the Electromigration and Stress Migration Resistance of Physical-Vapor-Deposited Copper Interconnect
• Effect of Aluminum Seed Layer on the Crystallographic Texture and Electromigration Resistance of Physical Vapor Deposited Copper Interconnect
• Analysis of Average Transport Critical Current Density of Oxide Superconductors Deposited on a Silver Base

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