Sun Jack | Taiwan Semiconductor Manufacturing Co. R&d
スポンサーリンク
概要
関連著者
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Sun Jack
Taiwan Semiconductor Manufacturing Co. R&d
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Lee Kuo-hua
Taiwan Semiconductor Manufacturing Co. R&d
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Wu Shien-yang
Taiwan Semiconductor Manufacturing Co. R&d
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Lee K‐h
Taiwan Semiconductor Manufacturing Co. R&d
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Wu Shien-Yang
Taiwan Semiconductor Manufacturuing Company
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SU Hung-Der
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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CHIOU Bi-Shiou
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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CHANG Ming-Hsung
Taiwan Semiconductor Manufacturing Co., R&D
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CHAO Chih-Ping
Taiwan Semiconductor Manufacturing Co., R&D
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Chiou B‐s
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chiou Bi-shiou
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Su Hung-der
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chao Chih-ping
Taiwan Semiconductor Manufacturing Co. R&d
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Chang Ming-hsung
Taiwan Semiconductor Manufacturing Co. R&d
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CHEN Yung-Shun
Taiwan Semiconductor Manufacturing Co., R&D
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SEE Yee-Chaung
Taiwan Semiconductor Manufacturing Co., R&D
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Chen Yung-shun
Taiwan Semiconductor Manufacturing Co. R&d
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See Yee-Chaung
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC
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Sun J
Taiwan Semiconductor Manufacturing Co. Hsin‐chu Twn
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LIEW Boon-Khim
Taiwan Semiconductor Manufacturing Company, R&D Device Department
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Diaz Carlos
Taiwan Semiconductor Manufacturuing Company
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Liew Boon-khim
Taiwan Semiconductor Manufacturing Company R&d Device Department
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Liew B‐k
Taiwan Semiconductor Manufacturuing Company
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Wang Chih-Chiang
Taiwan Semiconductor Manufacturuing Company
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Lin Yai-Fen
Taiwan Semiconductor Manufacturuing Company
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Kuo Di-Son
Taiwan Semiconductor Manufacturuing Company
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Lin Hua-Tai
Taiwan Semiconductor Manufacturuing Company
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Yen Anthony
Taiwan Semiconductor Manufacturuing Company
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KO Chin-Yuan
Taiwan Semiconductor Manufacturing Co., RA
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LU Ping-Chiang
Taiwan Semiconductor Manufacturing Co., R&D
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SEE Yee-Chanung
Taiwan Semiconductor Manufacturing Co., R&D
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Ko Chin-yuan
Taiwan Semiconductor Manufacturing Co. Ra
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Lu Ping-chiang
Taiwan Semiconductor Manufacturing Co. R&d
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See Yee-chanung
Taiwan Semiconductor Manufacturing Co. R&d
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See Yee-Chaung
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC
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Lee Kuo-Hua
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC
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Sun Jack
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC
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Ko Chin-Yuan
Taiwan Semiconductor Manufacturing Co., RA, Hsin-Chu 300,Taiwan, ROC
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Sun Jack
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC
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Chiou Bi-Shiou
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, ROC
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Chiou Bi-Shiou
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsin-Chu 300, Taiwan, ROC
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Chen Yung-Shun
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC
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Chen Yung-Shun
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC
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Su Hung-Der
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, ROC
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Su Hung-Der
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsin-Chu 300, Taiwan, ROC
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Wu Shien-Yang
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC
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Chang Ming-Hsung
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC
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Chao Chih-Ping
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC
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Chao Chih-Ping
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC
著作論文
- Application of Technology CAD in Process Development for High Performance Logic and System-on-Chip in IC Foundry (Special lssue on SISPAD'99)
- Bi-Mode Breakdown Test Methodology of Ultrathin Oxide
- Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide
- Novel Chip Standby Current Prediction Model and Ultrathin Gate Oxide Scaling Limit(Semiconductors)
- Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide
- Bi-Mode Breakdown Test Methodology of Ultrathin Oxide