Sun Jack | Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC

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概要

• Sun Jack Yuan-Chenの詳細を見る
• 同名の論文著者
• Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROCの論文著者

関連著者

• Sun Jack

  Taiwan Semiconductor Manufacturing Co. R&d

• Lee Kuo-hua

  Taiwan Semiconductor Manufacturing Co. R&d

• Wu Shien-yang

  Taiwan Semiconductor Manufacturing Co. R&d

• Chiou Bi-shiou

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Chen Yung-shun

  Taiwan Semiconductor Manufacturing Co. R&d

• Su Hung-der

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Chao Chih-ping

  Taiwan Semiconductor Manufacturing Co. R&d

• Chang Ming-hsung

  Taiwan Semiconductor Manufacturing Co. R&d

• See Yee-Chaung

  Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC

• See Yee-Chaung

  Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC

• Sun Jack

  Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC

• Chiou Bi-Shiou

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, ROC

• Chen Yung-Shun

  Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC

• Su Hung-Der

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, ROC

• Chang Ming-Hsung

  Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC

• Chao Chih-Ping

  Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu, Taiwan, ROC

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著作論文

• Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide

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