Chao Chih-ping | Taiwan Semiconductor Manufacturing Co. R&d
スポンサーリンク
概要
関連著者
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Sun Jack
Taiwan Semiconductor Manufacturing Co. R&d
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Lee Kuo-hua
Taiwan Semiconductor Manufacturing Co. R&d
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Chiou Bi-shiou
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Su Hung-der
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chao Chih-ping
Taiwan Semiconductor Manufacturing Co. R&d
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Chang Ming-hsung
Taiwan Semiconductor Manufacturing Co. R&d
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Wu Shien-yang
Taiwan Semiconductor Manufacturing Co. R&d
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Chen Yung-shun
Taiwan Semiconductor Manufacturing Co. R&d
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See Yee-Chaung
Taiwan Semiconductor Manufacturing Co., R&D, Hsin-Chu 300, Taiwan, ROC
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Lee K‐h
Taiwan Semiconductor Manufacturing Co. R&d
著作論文
- Novel Chip Standby Current Prediction Model and Ultrathin Gate Oxide Scaling Limit(Semiconductors)
- Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide
- Bi-Mode Breakdown Test Methodology of Ultrathin Oxide