Lee K‐h | Taiwan Semiconductor Manufacturing Co. R&d
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概要
関連著者
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Lee K‐h
Taiwan Semiconductor Manufacturing Co. R&d
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Lee Kuo-hua
Taiwan Semiconductor Manufacturing Co. R&d
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Sun Jack
Taiwan Semiconductor Manufacturing Co. R&d
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SU Hung-Der
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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CHIOU Bi-Shiou
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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CHANG Ming-Hsung
Taiwan Semiconductor Manufacturing Co., R&D
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CHAO Chih-Ping
Taiwan Semiconductor Manufacturing Co., R&D
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Chiou B‐s
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Wu Shien-Yang
Taiwan Semiconductor Manufacturuing Company
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CHEN Yung-Shun
Taiwan Semiconductor Manufacturing Co., R&D
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SEE Yee-Chaung
Taiwan Semiconductor Manufacturing Co., R&D
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Wu Shien-yang
Taiwan Semiconductor Manufacturing Co. R&d
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KO Chin-Yuan
Taiwan Semiconductor Manufacturing Co., RA
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LU Ping-Chiang
Taiwan Semiconductor Manufacturing Co., R&D
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SEE Yee-Chanung
Taiwan Semiconductor Manufacturing Co., R&D
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HWANG Jun-Dar
VLSI Technology Laboratory, Department of Electrical Engineering, National Cheng Kung University
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Chen F‐y
National Cheng Kung Univ. Tainan Twn
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Chiou Bi-shiou
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Hwang Jun-dar
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kung University
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Su Hung-der
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Lu Ping-chiang
Taiwan Semiconductor Manufacturing Co. R&d
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See Yee-chanung
Taiwan Semiconductor Manufacturing Co. R&d
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Chao Chih-ping
Taiwan Semiconductor Manufacturing Co. R&d
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Lee Kuen-hsien
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kung University
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Fang Yeau-kuen
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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Chen Fu-Yuan
VLSI Technology Laboratory, Department of Electrical Engineering, National Cheng Kung University
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Chen Fu-yuan
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kung University
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Chang Ming-hsung
Taiwan Semiconductor Manufacturing Co. R&d
著作論文
- Bi-Mode Breakdown Test Methodology of Ultrathin Oxide
- Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide
- Novel Chip Standby Current Prediction Model and Ultrathin Gate Oxide Scaling Limit(Semiconductors)
- Novel Amorphous-Silicon-Based Double-Metal Antifuse with Barrier Enhancement Layer