SEE Yee-Chaung | Taiwan Semiconductor Manufacturing Co., R&D

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概要

• 同名の論文著者
• Taiwan Semiconductor Manufacturing Co., R&Dの論文著者

関連著者

• Sun Jack

  Taiwan Semiconductor Manufacturing Co. R&d

• Lee K‐h

  Taiwan Semiconductor Manufacturing Co. R&d

• Lee Kuo-hua

  Taiwan Semiconductor Manufacturing Co. R&d

• Wu Shien-Yang

  Taiwan Semiconductor Manufacturuing Company

• SU Hung-Der

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University

• CHIOU Bi-Shiou

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University

• CHANG Ming-Hsung

  Taiwan Semiconductor Manufacturing Co., R&D

• CHEN Yung-Shun

  Taiwan Semiconductor Manufacturing Co., R&D

• CHAO Chih-Ping

  Taiwan Semiconductor Manufacturing Co., R&D

• SEE Yee-Chaung

  Taiwan Semiconductor Manufacturing Co., R&D

• Chiou B‐s

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Wu Shien-yang

  Taiwan Semiconductor Manufacturing Co. R&d

• KO Chin-Yuan

  Taiwan Semiconductor Manufacturing Co., RA

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著作論文

• Bi-Mode Breakdown Test Methodology of Ultrathin Oxide
• Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide

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