CHIOU Bi-Shiou | Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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概要
- 同名の論文著者
- Department of Electronics Engineering and Institute of Electronics, National Chiao Tung Universityの論文著者
関連著者
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CHIOU Bi-Shiou
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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Chiou B‐s
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chiou Bi-shiou
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Sun Jack
Taiwan Semiconductor Manufacturing Co. R&d
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Lee K‐h
Taiwan Semiconductor Manufacturing Co. R&d
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Lee Kuo-hua
Taiwan Semiconductor Manufacturing Co. R&d
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SU Hung-Der
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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CHANG Ming-Hsung
Taiwan Semiconductor Manufacturing Co., R&D
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CHAO Chih-Ping
Taiwan Semiconductor Manufacturing Co., R&D
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CHENG Huang-Chung
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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Wu Shien-Yang
Taiwan Semiconductor Manufacturuing Company
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SHYE Der-Chi
Department of Electronics Engineering, Mingchi University of Technology
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CHEN Jyh-Shin
Precision Instrument Development Center
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Wu Wen-fa
National Nano Device Laboratories
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CHEN Yung-Shun
Taiwan Semiconductor Manufacturing Co., R&D
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SEE Yee-Chaung
Taiwan Semiconductor Manufacturing Co., R&D
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Wu Shien-yang
Taiwan Semiconductor Manufacturing Co. R&d
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Chin Y‐l
National Chiao Tung Univ. Hsinchu Twn
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CHIN Yu-Lung
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University,
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HWANG Chuan-Chou
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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JAING Cheng-Chung
Precision Instrument Development Center (PIDC), National Science Council (NSC)
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Chin Yu-lung
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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KO Chin-Yuan
Taiwan Semiconductor Manufacturing Co., RA
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LU Ping-Chiang
Taiwan Semiconductor Manufacturing Co., R&D
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SEE Yee-Chanung
Taiwan Semiconductor Manufacturing Co., R&D
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Lai Ming-jiunn
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Su Hung-der
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Shye Der-chi
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Lu Ping-chiang
Taiwan Semiconductor Manufacturing Co. R&d
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See Yee-chanung
Taiwan Semiconductor Manufacturing Co. R&d
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Chao Chih-ping
Taiwan Semiconductor Manufacturing Co. R&d
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Cheng Huang-chung
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tang University
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HUANG Stewart
Mosel Vitelic Incorporation
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JUANG Miin-Horng
Department of Electronics Engineering, National Taiwan University of Science and Technology
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HSU Hsien-Wen
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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Hsu Hsien-wen
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chen Jyh-shin
Precision Instrument Development Center (pidc)
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Jaing Cheng-chung
Precision Instrument Development Center (pidc)
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Hwang Chuan-chou
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chang Ming-hsung
Taiwan Semiconductor Manufacturing Co. R&d
著作論文
- Bi-Mode Breakdown Test Methodology of Ultrathin Oxide
- Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide
- Novel Chip Standby Current Prediction Model and Ultrathin Gate Oxide Scaling Limit(Semiconductors)
- Effect of the Tantalum Barrier Layer on the Electromigration and Stress Migration Resistance of Physical-Vapor-Deposited Copper Interconnect
- Effect of Aluminum Seed Layer on the Crystallographic Texture and Electromigration Resistance of Physical Vapor Deposited Copper Interconnect
- The Effects of Post Excimer Laser Annealing on (Ba,Sr)TiO_3 Thin Films at Low Substrate Temperatures
- Effects of Post-Oxygen Plasma Treatment on Pt/(Ba,Sr)TiO_3/Pt Capacitors at Low Substrate Temperatures