KAMEDA Naoto | Meidensha Corporation
スポンサーリンク
概要
関連著者
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KAMEDA Naoto
Meidensha Corporation
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NISHIGUCHI Tetsuya
Meidensha Corporation
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NONAKA Hidehiko
National Institute of Advanced Industrial Science and Technology (AIST)
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MORIKAWA Yoshiki
Meidensha Corporation
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KEKURA Mitsuru
Meidensha Corporation
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Morikawa Y
Meidensha Corporation
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Nishiguchi T
Meidensha Corporation
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Ichimura S
National Inst. Advanced Industrial Sci. And Technol.(aist) Ibaraki Jpn
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Nakamura K
Tokyo Electron Ltd. Tokyo Jpn
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Ichimura Shingo
National Inst. Of Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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Nonakai Hidehiko
National Institute Of Advanced Industrial Science And Technology (aist)
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Kawamura Ichiro
Central Research And Development Laboratory Showa Shell Sekiyu K.k.
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Nakamura K
Display Device Research And Development Department Nippondenso Co. Ltd.
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Nakamura Keiji
Department Of Electrical Engineering School Of Engineering Nagoya University
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Nakamura K
Nagoya University Department Of Electrical Engineering
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ICHIMURA Shingo
National Institute of Advanced Industrial Science and Technology (AIST)
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Nakamura Kentaro
湘南工科大学
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中村 僖良
National Institute Of Advanced Industrial Science And Technology (aist)
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NAKAMURA Ken
National Institute of Advanced Industrial Science and Technology (AIST)
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USHIYAMA Tomoharu
National Institute of Advanced Industrial Science and Technology (AIST)
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ICHUMURA Shingo
National Institute of Advanced Industrial Science and Technology (AIST)
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Kameda Naoto
Meidensha Corporation, Core Technology Research Laboratories, Numazu, Shizuoka 410-8588, Japan
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Kekura Mitsuru
Meidensha Corporation, Core Technology Research Laboratories, Numazu, Shizuoka 410-8588, Japan
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Ichimura Shingo
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8565, Japan
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Morikawa Yoshiki
Meidensha Corporation, Core Technology Research Laboratories, Numazu, Shizuoka 410-8588, Japan
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NAKAMURA Ken
National Institute for Agro-Environmental Sciences
著作論文
- Evaluation of Outermost Surface Temperature of Silicon Substrates during UV-Excited Ozone Oxidation at Low Temperature
- Photochemical reaction of ozone and 1,1,1,3,3,3-hexamethyldisilazane: analysis of the gas reaction between precursors in a photochemical vapor deposition process
- Advantage of highly concentrated ([greater-than or equal to]90%) ozone for chemical vapor deposition SiO2 grown under 200℃ using hexamethyldisilazane and ultraviolet light excited ozone (Special issue: Dielectric thin films for future ULSI devices: scienc
- Nanoscale-order Homogeneous Structure of SiO_2 Film on Poly-silicon Grown at Room Temperature using UV Light Excited Ozone
- Advantage of Highly Concentrated (${\geq}90$%) Ozone for Chemical Vapor Deposition SiO2 Grown under 200 °C Using Hexamethyldisilazane and Ultraviolet Light Excited Ozone