TERASHIMA Kazutaka | Optoelectronics Joint Research Laboratory
スポンサーリンク
概要
関連著者
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TERASHIMA Kazutaka
Optoelectronics Joint Research Laboratory
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Fukuda Tsuguo
Optoelectronics Joint Research Laboratory
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Terashima K
Nec Corp. Kanagawa Jpn
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Ishida Koichi
Optoelectronics Joint Research Laboratory:(present Address) Fundamental Research Laboratories Nec Co
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Ishida Koichi
Optoelectronics Joint Research Laboratory
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KIKUTA Toshio
Optoelectronics Joint Research Laboratory
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ORITO Fumio
Optoelectronics Joint Research Laboratory
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Katsumata T
Department Of Applied Chemistry Toyo University
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KATSUMATA Tooru
Optoelectronics Joint Research Laboratory
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NAKAJIMA Masato
Optoelectronics Joint Research Laboratory
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Nakajima M
Optoelectronics Joint Research Laboratory
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Nakajima M
Toshiba Corp. Kawasaki
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Nakajima M
Mitsubishi Electric Corp. Amagasaki
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Emori Haruo
Optoelectronics Joint Research Laboratory
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Matsumura T
Department Of Electronic Engineering Faculty Of Engineering Gunma University
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MATSUMURA Takao
Optoelectronics Joint Research Laboratory
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KATSUMATA Tooru
Optoelectronics Joint-Research Laboratory
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Nakajima Hiroaki
Optoelectronics Joint Research Laboratory
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石田 謙司
神戸大学 大学院工学研究科
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SHIMADA Takashi
Optoelectronics Joint Research Laboratory
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OBOKATA Takeshi
Optoelectronics Joint Research Laboratory
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Sato Takashi
Optoelectronics Joint Research Laboratory
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Ozawa Shoichi
Optoelectronics Joint Research Laboratory
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KATSUMATA Tohru
Optoelectronics Joint Research Laboratory
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OBOKATA Takeshi
Optoelectronics Joint-Research Laboratory
著作論文
- Study of 0.8 eV Deep Level Photoluminescence in Undoped LEC Semi-Insulating GaAs
- Study of Two Different Deep Levels in Undoped LEC SI-GaAs by Photoluminescence Spectroscopy
- Effect of Melt Stoichiometry on Electrical Activation Uniformity of Si-Implanted Layers in Undoped Semi-Insulating GaAs
- Striations in Undoped Semi-Insulating LEC GaAs
- Improved Uniformity of Resistivity Distribution in LEC Semi-Insulating GaAs Produced by Annealing
- Resistivity, Hall Mobility and Leakage Current Variations in Undoped Semi-Insulating GaAs Crystal Grown by LEC Method
- Growth of Low and Homogeneous Dislocation Density GaAs Crystal by Improved LEC Technique
- LEC Growth Technique for Homogeneous Undoped Semi-Insulating GaAs Single Crystals with in-situ Melt Purification Process
- Effect of Magnetic Field on Residual Impurity Concentration in LEC GaAs Single Crystal
- Vertical Magnetic Field Applied LEC Apparatus for Large Diameter GaAs Single Crystal Growth
- Electrical Resistivity of Undoped GaAs Single Crystals Grown by Magnetic Field Applied LEC Technique