Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2003-04-30

著者

• TSUCHIYA Toshiaki

  Interdisciplinary Faculty of Science and Engineering, Shimane University

• Yoshida Toshiyuki

  Interdisciplinary Faculty Of Science And Engineering Shimane University

• Sasaki Nobuo

  Silicon Technologies Labs Fujitsu Laboratories Ltd.

• EBIKO Toshiki

  Silicon Technologies Labs, Fujitsu Laboratories LTD.

• TAKEI Michiko

  Silicon Technologies Labs, Fujitsu Laboratories LTD.

関連論文

• Low-Frequency Noise in Si_Ge_x p-Channel Metal Oxide Semiconductor Field-Effect Transistors : Semiconductors
• Influence of Doping Gradient near a Channel End on Parasitic Series Resistance of Thin-Film Fully-Depleted Metal-Oxide-Semiconductor Field-Effect Transistors
• Body-Charge-Induced Switching Characteristics in Fully Depleted Silicon-on-Insulator Digital Circuits
• Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
• Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors
• Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body SOI MOSFETs
• Modification of Surface State Density Distribution of p-InP Surfaces by Nitrogen Radical Exposure
• Quantitative Evaluation of Interface Traps in a Nanometer-Thick SiGe/Si Heterostructure in Hetero MOS Devices(Session 1 Silicon Devices I,AWAD2006)
• Quantitative Evaluation of Interface Traps in a Nanometer-Thick SiGe/Si Heterostructure in Hetero MOS Devices(Session 1 Silicon Devices I,AWAD2006)
• Matching Properties of Polycrystalline Silicon Thin-Film Transistors Studied Using Wide-Use Circuit Simulator
• Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

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