Sasaki Nobuo | Silicon Technologies Labs Fujitsu Laboratories Ltd.
スポンサーリンク
概要
関連著者
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Yoshida Toshiyuki
Interdisciplinary Faculty Of Science And Engineering Shimane University
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Sasaki Nobuo
Silicon Technologies Labs Fujitsu Laboratories Ltd.
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TSUCHIYA Toshiaki
Interdisciplinary Faculty of Science and Engineering, Shimane University
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EBIKO Toshiki
Silicon Technologies Labs, Fujitsu Laboratories LTD.
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TAKEI Michiko
Silicon Technologies Labs, Fujitsu Laboratories LTD.
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Takei Michiko
Silicon Technologies Labs Fujitsu Laboratories Ltd.
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Tsuchiya Toshiaki
Interdisciplinary Faculty Of Science And Engineering Shimane University
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Sasaki Nobuo
Silicon Technologies Labs, Fujitsu Laboratories LTD., 10-1 Wakamiya, Morinosato, Atsugi, Kanagawa 243-0197, Japan
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Takei Michiko
Silicon Technologies Labs, Fujitsu Laboratories LTD., 10-1 Wakamiya, Morinosato, Atsugi, Kanagawa 243-0197, Japan
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Ebiko Yoshiki
Silicon Technologies Labs, Fujitsu Laboratories LTD., 10-1 Wakamiya, Morinosato, Atsugi, Kanagawa 243-0197, Japan
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Yoshida Toshiyuki
Interdisciplinary Faculty of Science and Engineering, Shimane University, 1060 Nishikawatsu, Matsue, Shimane 690-8504, Japan
著作論文
- Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
- Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors