Study on the effects of Zr-incorporated InZnO thin-film transistors using a solution process

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Kim Hyun

  School of Advanced Materials Science and Engineering, Center for Advanced Plasma Surface Technology, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, Republic of Korea

• Jeong Woong

  School of Electrical and Electronic Engineering, Yonsei University, 262 Seongsanno, Seodaemoon-gu, Seoul 120-749, Korea

• Kim Dong

  School of Clinical Sciences, University of Bristol

• Jeong Tae

  School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea

• Kim Si

  School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea

• Yoon Doo

  School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea

• Lim Hyun

  School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Republic of Korea

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