Liquid Crystal Alignment Effects and Electro Optical Performances of Twisted Nematic-Liquid Crystal Display Using Ion-Beam Alignment Method on Nitrogen-doped Diamond Like Carbon Thin Film Layer
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概要
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Nitrogen-doped diamond-like carbon (NDLC) thin films exhibit a high electrical resistivity that is similar to the properties shown by diamond-like carbon (DLC) thin films. The diamond-like transport property in NDLC thin films comes from a material consisting of sp2-bonded carbon versus the sp3-bonded carbon of DLC. In addition, NDLC thin films have a better thermal stability than the DLC thin films, because C:N bonding in the NDLC thin films is stronger against thermal stress than C:H bonding in the DLC thin films. The liquid crystal (LC) alignment effects of ion beam irradiation on the NDLC thin films and the electro optical (EO) performances of the ion-beam-aligned twisted nematic (TN)-liquid crystal display (LCD) with oblique ion beam exposure on an NDLC thin film surface were studied. A good uniform nematic liquid crystal (NLC) alignment with ion beam exposure on the NDLC thin films was observed. In addition, good EO properties, a residual DC property and particularly the good thermal stability of the ion-beam-aligned TN-LCD on NDLC thin films was achieved.
- 2005-03-15
著者
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Seo Dae-shik
Department Of Electrical & Computer Engineering College Of Engineering Yonsei University
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Kang Hyung-ku
Department Of Electrical And Electronic Engineering Yonsei University
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Ahn Han-jin
Department Of Metallurgical Engineering College Of Engineering Yonsei University
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Kim Kyung-chan
Department Of Metallurgical Engineering College Of Engineering Yonsei University
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Park Chang-joon
Department Of Electrical And Electronic Engineering College Of Engineering Yonsei University
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Baik Hong-koo
Department Of Metallurgical Engineering College Of Engineering Yonsei University
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Kim Jong-bok
Department Of Metallurgical Engineering College Of Engineering Yonsei University
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Hwang Jeoung-yeon
Department Of Electrical & Computer Engineering College Of Engineering Yonsei University
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Kim Kyung-Chan
Department of Metallurgical Engineering, College of Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Kang Hyung-Ku
Department of Electrical and Electronic Engineering, College of Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Ahn Han-Jin
Department of Metallurgical Engineering, College of Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Park Chang-Joon
Department of Electrical and Electronic Engineering, College of Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Baik Hong-Koo
Department of Metallurgical Engineering, College of Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Kim Jong-Bok
Department of Metallurgical Engineering, College of Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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Hwang Jeoung-Yeon
Department of Electrical and Electronic Engineering, College of Engineering, Yonsei University, 134 Shinchon-dong, Seodaemoon-ku, Seoul 120-749, Korea
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