High-Throughput Measurement Method for Time--Temperature-Transformation Diagram of Thin Film Amorphous Alloys
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概要
- 論文の詳細を見る
The time--temperature-transformation (TTT) diagram of amorphous alloys is important for the applications of alloys. However, measurement for it by the conventional method is a time-consuming process. We propose a high-throughput measurement method for compiling TTT diagrams of thin film amorphous alloys. For this method, a temperature gradient furnace system is used. The thin film sample is isothermally heated with a temperature gradient and monitored by thermography. Thermography can detect crystallization. Therefore, the times required for crystallization at various temperatures can be measured at once. The validity of this method is shown by comparison with the results of the conventional method.
- 2010-12-25
著者
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SAKURAI Junpei
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Shimokohbe Akira
Precision & Intelligence Laboratory Tokyo Institute Of Technology
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Hata Seiichi
Precision And Intelligence Laboratory Tokyo Institute Of Technology
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Aono Yuko
Precision and Intelligence Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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Ishida Tetsuo
PVR Corporation, Maebashi 371-0032, Japan
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AONO Yuko
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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