AONO Yuko | Precision and Intelligence Laboratory, Tokyo Institute of Technology
スポンサーリンク
概要
関連著者
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SAKURAI Junpei
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Shimokohbe Akira
Precision & Intelligence Laboratory Tokyo Institute Of Technology
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Hata Seiichi
Precision And Intelligence Laboratory Tokyo Institute Of Technology
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AONO Yuko
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Aono Yuko
Precision and Intelligence Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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Shimokohbe Akira
Precision and Intelligence Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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Hata Seiichi
Precision and Intelligence Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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SHIMOKOHBE Akira
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Sakurai Junpei
Precision and Intelligence Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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Ishida Tetsuo
PVR Corporation, Maebashi 371-0032, Japan
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ABE Mitsuhiro
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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ANDO Masayuki
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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SHENGXIAN Jiang
Precision and Intelligence Laboratory, Tokyo Institute of Technology
著作論文
- Novel thermographic method for characterizing transformation temperatures of thin-film shape memory alloys aimed at combinatorial approach
- High-Throughput Measurement Method for Time--Temperature-Transformation Diagram of Thin Film Amorphous Alloys
- High-Throughput Characterization Method for Crystallization Temperature of Integrated Thin Film Amorphous Alloys Using Thermography
- Evaluation of the Validity of Crystallization Temperature Measurements Using Thermography with Different Sample Configurations
- Effect of Sputtering Method on Characteristics of Amorphous Ni-Nb-Zr Alloys for Glass Lenses Molding Die Materials