Crystal Structure Analysis of Multiwalled Carbon Nanotube Forests by Newly Developed Cross-Sectional X-ray Diffraction Measurement

スポンサーリンク

概要

• 論文の詳細を見る

• A novel cross-sectional X-ray diffraction method was developed to evaluate crystal structures of multiwalled carbon nanotube (CNT) forests. Aligned degree of the graphene volume in the CNT forest could be quantified by this analysis. The domain sizes of the CNTs in the forests were estimated using a modified Scherrer's equation for bending multilayered graphene sheets. The statistical information of the crystal structure of the CNT forests including the degree of alignment, domain size, layer numbers, and interlayer spacing $d_{002}$ will contribute to developing applications of CNT forests for devices and functional materials.

• 2010-10-25

著者

• Furuta Mamoru

  Research Institute For Nano-devices Kochi University Of Technology

• HIRAO Takashi

  Research Institute, Kochi University of Technology

• Furuta Hiroshi

  Research Institute For Nano-devices Kochi University Of Technology

• Komukai Takuji

  Nitta Corporation

• SHIMOMOTO Yutaka

  Nitta Corporation

• OGUCHI Toshiyuki

  Nitta Corporation

• Yoshihara Kumiko

  Nitta Corp. Osaka Jpn

• Kawabata Katsumasa

  Research Institute For Nanodevices Kochi University Of Technology

• Kawaharamura Toshiyuki

  Research Institute For Nano-devices Kochi University Of Technology

• Shimomoto Yutaka

  Nitta Corporation, Osaka 556-0022, Japan

• Komukai Takuji

  Nitta Corporation, Osaka 556-0022, Japan

• Kawaharamura Toshiyuki

  Research Institute for Nanodevices, Kochi University of Technology, Kami, Kochi 782-8502, Japan

• Furuta Mamoru

  Research Institute for Nanodevices, Kochi University of Technology, Kami, Kochi 782-8502, Japan

• Hirao Takashi

  Research Institute for Nanodevices, Kochi University of Technology, Kami, Kochi 782-8502, Japan

• Yoshihara Kumiko

  Nitta Corporation, Osaka 556-0022, Japan

• Kawabata Katsumasa

  Research Institute for Nanodevices, Kochi University of Technology, Kami, Kochi 782-8502, Japan

• Oguchi Toshiyuki

  Nitta Corporation, Osaka 556-0022, Japan

関連論文

• Low-Temperature Growth of Carbon Nanofiber by Thermal Chemical Vapor Deposition Using CuNi Catalyst
• Enhanced nucleation of microcrystalline silicon thin films deposited by inductively coupled plasma chemical vapor deposition with low-frequency pulse substrate bias
• Intense Green Cathodoluminescence from Low-Temperature-Deposited ZnO Film with Fluted Hexagonal Cone Nanostructures
• SiO_2 Insulator Film Synthesized at 100℃ Using Tetramethylsilane by Inductively Coupled Plasma Chemical Vapor Deposition
• Effect of energetic particle bombardment on microstructure of zinc oxide films deposited by RF magnetron sputtering
• Influence of thermal annealing on microstructures of zinc oxide films deposited by RF magnetron sputtering
• Density Control of Carbon Nanotubes through the Thickness of Fe/Al Multilayer Catalyst
• Formation of Vertically Aligned Carbon Nanotubes by Dual-RF-Plasma Chemical Vapor Deposition : Surfaces, Interfaces, and Films
• Crystal structure analysis of multiwalled carbon nanotube forests by newly developed cross-sectional X-ray diffraction measurement
• Effect of Ion Trapping Films on the Electrooptic Characteristics of Polymer-Stabilized Ferroelectric Liquid Crystal Display Exhibiting V-Shaped Switching
• Influence of the Surface Alignment Conditions and the Polymer Stabilization on the Electrooptic Characteristics of Ferroelectric Liquid Crystal Displays Exhibiting Half-V Switching : A Comparison of Photoalignment and Rubbing Technique : Structure and Mec
• A $128\times 96$ Pixel Stack-Type Color Image Sensor: Stack of Individual Blue-, Green-, and Red-Sensitive Organic Photoconductive Films Integrated with a ZnO Thin Film Transistor Readout Circuit
• Estimation of Frequency Accuracy and Stability in a Diode Laser-Pumped Rubidium Beam Atomic Clock Using a Novel Microwave Resonant Method
• Positive Bias Instability of Bottom-Gate Zinc Oxide Thin-Film Transistors with a SiOx/SiNx-Stacked Gate Insulator
• Crystal Structure Analysis of Multiwalled Carbon Nanotube Forests by Newly Developed Cross-Sectional X-ray Diffraction Measurement
• Crystal Structure Analysis of Multiwalled Carbon Nanotube Forests by Newly Developed Cross-Sectional X-ray Diffraction Measurement
• Enhanced Nucleation of Microcrystalline Silicon Thin Films Deposited by Inductively Coupled Plasma Chemical Vapor Deposition with Low-Frequency Pulse Substrate Bias
• Effect of Pulsed Substrate Bias on Film Properties of SiO2 Deposited by Inductively Coupled Plasma Chemical Vapor Deposition
• Low-Temperature Growth of Carbon Nanofiber by Thermal Chemical Vapor Deposition Using CuNi Catalyst
• SiO2 Insulator Film Synthesized at 100 °C Using Tetramethylsilane by Inductively Coupled Plasma Chemical Vapor Deposition
• Structural Analysis of High-Density Vertically Aligned Carbon Nanotubes Grown by Thermal Chemical Vapor Deposition with Fe/Al Multilayer Catalyst
• Influence of Thermal Annealing on Microstructures of Zinc Oxide Films Deposited by RF Magnetron Sputtering
• Effect of Energetic Particle Bombardment on Microstructure of Zinc Oxide Films Deposited by RF Magnetron Sputtering

もっと見る 閉じる

スポンサーリンク