Substrate-Noise and Random-Variability Reduction with Self-Adjusted Forward Body Bias(Digital,<Special Section>Low-Power, High-Speed LSIs and Related Technologies)
スポンサーリンク
概要
- 論文の詳細を見る
This paper describes a method of reducing substrate noise and random variability utilizing a self-adjusted forward body bias (SAFBB) circuit. To achieve this, we designed a test chip (130nm CMOS 3-well) that contained an on-chip oscilloscope for detecting dynamic noise from various frequency noise sources, and another test chip (90nm CMOS 2-well) that contained 10-M transistors for measuring random variability tendencies. Under SA-FBB conditions, it reduced noise by 35.3-69.8% and reduced random variability σ-(I_<ds>) by 23.2-57.9%.
- 社団法人電子情報通信学会の論文
- 2007-04-01
著者
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Nagata Makoto
Kobe Univ. Kobe‐shi Jpn
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Komatsu Yoshihide
Matsushita Electric Industrial Co. Ltd. Moriguchi‐shi Jpn
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Komatsu Yoshihide
Matsushita Electric Industrial Co. Ltd.
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Ishibashi Koichiro
Renesas Technology
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Nagata Makoto
Kobe University
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Nagata Makoto
Kobe Univ.
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KOMATSU Yoshihide
Matsushita (Panasonic)
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