Nagata Makoto | Kobe Univ.

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概要

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著作論文

Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation
Experimental Verification of Power Supply Noise Modeling for EMI Analysis through On-Board and On-Chip Noise Measurements(Analog Circuits and Related SoC Integration Technologies)
An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs(Novel Device Architectures and System Integration Technologies)
Dynamic Power-Supply and Well Noise Measurements and Analysis for Low Power Body Biased Circuits(Digital, Low-Power LSI and Low-Power IP)
Substrate-Noise and Random-Variability Reduction with Self-Adjusted Forward Body Bias(Digital,Low-Power, High-Speed LSIs and Related Technologies)
Multi-Ported Register File for Reducing the Impact of PVT Variation (Signal Integrity and Variability, VLSI Design Technology in the Sub-100nm Era)

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