PF1 Some New Applications of Scanning Electron Acoustic Microscope to Materials Evaluation
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概要
- 論文の詳細を見る
- 超音波エレクトロニクスの基礎と応用に関するシンポジウム運営委員会の論文
- 1997-11-12
著者
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Kojima S
Univ. Tsukuba Ibaraki Jpn
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KOJIMA Seiji
Institute of Applied Physics, University of Tsukuba
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Kojima S
Institute Of Materials Science University Of Tsukuba
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Kojima Seiji
Institute Of Applied Physics University Of Tsukuba
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Zhang B
Research Center For Nano-device And System Nagoya Institute Of Technology
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ZHANG Bingyang
Shanghai Institute of Ceramics, Chinese Academy of Sciences
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YIN Qingrui
Shanghai Institute of Ceramics, Chinese Academy of Sciences
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Fuming Jiang
Institute of Applied Physics, University of Tsukuba
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Yin Q
Shanghai Inst. Of Ceramics Chinese Acad. Of Sci. Shanghai Chn
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Jiang F
Univ. Tsukuba Ibaraki Jpn
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Yin Qingrui
Shanghai Institute Of Ceramics Chinese Academy Of Sciences
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Kojima Seiji
The Institute For Solid State Physics The University Of Tokyo
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Kojima Seiji
Institute For Solid State Physics University Of Tokyo
関連論文
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- Measurement of Local Lattice Distortion in Silicon by Imaging-Plate Plane-Wave X-Ray Topography with Image Magnification
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