Prediction of resistance of electric contact with plated layer (1) : Theoretical analyses
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概要
- 論文の詳細を見る
Electrical contacts are an important part of electrical circuits and many reliability problems are related to electrical contacts' failure. It is important to investigate relationship between load and contact resistance which made contact reliability. In this study, the effect of plating material and plating thickness on contact resistance was examined. The samples were constructed of a copper alloy with tin or silver plating. The resistance of the embossment shape and plane contact was measured by using a four-probe method with a load up to 40N. The relation between contact area and contact resistance is determined. As experimental result, the results show that the contact resistance depends on the indentation of the contact area. At in the same contact area, tin-plated samples have higher resistance than those that are silver-plated because of their own resistivity. The constriction resistance with a plating layer, which depends on contact area, plating material and plating thickness, is calculated by electrical field analysis in order to predict load-contact resistance. The constriction resistance with plating is shown by R=Φp/2a, using a surface resistance coefficient Φ theoretically. The theoretical results show good agreement with experimental results in the case of silver plating. In the case of tin plating, the experimental results are good agreement with experimental results at higher load region.
- 社団法人電子情報通信学会の論文
- 2008-11-08
著者
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Sawada Shigeru
Mie Univ. Tsu‐shi Jpn
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HATTORI Yasuhiro
AutoNetworks Technologies, Ltd.
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SAWADA Shigeru
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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HATTORI Yasuhiro
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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TAMAI Terutaka
Graduate School of Engineering, Mie University
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SHIMIZU Kaori
AutoNetworks Tech.
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SHIMIZU Kaori
Circuits and Connection R & D Division, AutoNetworks Technologies, Ltd.
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Tamai Terutaka
Mie Univ.
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Hattori Yasuhiro
Autonetworks Tech.
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Hattori Yasuhiro
Circuits And Connection R&d Division Autonetworks Technologies Ltd.
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