Observation of Tin Plated Fretting Contacts Using FIB-SEM

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In this report, Focused Ion Beam (FIB) — SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5µm.
2010-09-01

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関連論文

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