Observation of Tin Plated Fretting Contacts Using FIB-SEM
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概要
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In this report, Focused Ion Beam (FIB) — SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5µm.
- 2010-09-01
著者
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HATTORI Yasuhiro
AutoNetworks Technologies, Ltd.
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ITO Tetsuya
AutoNetwork Technologies, ltd.
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Nomura Yoshiyuki
Autonetworks Technologies Ltd.
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Ito Tetsuya
Circuits And Connection R&d Division Autonetworks Technologies Ltd.
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Hattori Yasuhiro
Autonetworks Tech.
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Hattori Yasuhiro
Autonetwork Technologies Ltd.
関連論文
- Press-Fit Connector for Automobile Electronic Control Units(Connectors & Sliding Contacts,Recent Development of Electromechanical Devices (Selected Papers from ICEC2006))
- Study of Fretting Corrosion in Early Stage
- Frequency Influencing of Fretting Corrosion of Tin Plated Contacts(Session 1 -Fretting-)
- Growth of Oxide Film on the Tin Plated Surface of Connector Contacts and Its effect Contact Resistance Characteristic
- The mechanism of a detailed surface transformation of fretting corrosion
- Influence of Fretting Wear on Lifetime of Tin Plated Connectors
- Electric Properties and Surface Conditions of Tin Plated Contact with Load
- Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
- Contact Resistance Characteristics of Improved Conductive Elastomer Contacts for Contaminated Printed Circuit Board in SO_2 Environment
- Micro-structural Study of Fretting Contact caused by the difference of the tin plating thickness(Session 1 -Fretting-)