Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot Construction
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概要
- 論文の詳細を見る
Constriction resistance is calculated by numerical analysis using Laplaces equations for electric potential of steady state in many cases of contact spot dispersion-status. The results show that contact resistance does not increase beyond 1.5 times even if the total real contact area is about 15% of the apparent contact area. When real contact area is at least about 60% of the apparent contact area, the contact resistance is approximately the same as the constriction resistance acquired from the apparent contact area. When the real contact area is about 50% of the apparent contact area, the contact resistance is approximately constant without regard to the contact shape and contact-point dispersion layout. Therefore, it is proved that contact resistance can be practically calculated using apparent contact area instead of real contact area when there are many contact points caused by metal to metal contact.
- (社)電子情報通信学会の論文
- 2010-06-01
著者
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Sawada Shigeru
Mie Univ. Tsu‐shi Jpn
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HATTORI Yasuhiro
AutoNetworks Technologies, Ltd.
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HATTORI Yasuhiro
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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TAMAI Terutaka
Graduate School of Engineering, Mie University
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IIDA Kazuo
Graduate School of Engineering, Mie University
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SAWADA Shigeru
Graduate School of Engineering, Mie University
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Iida Kazuo
Graduate School Of Engineering Mie University
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Tamai Terutaka
Mie Univ.
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Hattori Yasuhiro
Autonetworks Tech.
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Hattori Yasuhiro
Circuits And Connection R&d Division Autonetworks Technologies Ltd.
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