Sawada Shigeru | Mie Univ. Tsu‐shi Jpn
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概要
関連著者
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Sawada Shigeru
Mie Univ. Tsu‐shi Jpn
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HATTORI Yasuhiro
AutoNetworks Technologies, Ltd.
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Tamai Terutaka
Mie Univ.
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Hattori Yasuhiro
Autonetworks Tech.
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IIDA Kazuo
Graduate School of Engineering, Mie University
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Iida Kazuo
Graduate School Of Engineering Mie University
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Hattori Yasuhiro
Autonetwork Technologies Ltd.
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Hattori Yasuhiro
Circuits And Connection R&d Division Autonetworks Technologies Ltd.
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TAMAI Terutaka
Graduate School of Engineering, Mie University
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HATTORI Yasuhiro
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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Saitoh Yasushi
Mie University Graduate School Of Engineering Vehicle Network Technology Laboratory
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SAWADA Shigeru
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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SAWADA Shigeru
Graduate School of Engineering, Mie University
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Ito Tetsuya
Circuits And Connection R&d Division Autonetworks Technologies Ltd.
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TAMAI Terutaka
Mie University, Graduate School of Engineering, Vehicle Network Technology Laboratory
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ITO Tetsuya
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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SAITOH Yasushi
Graduate School of Engineering, Mie University
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SHIMIZU Kaori
AutoNetworks Tech.
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Saitoh Yasushi
Graduate School Of Engineering Mie University
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Tamai Terutaka
Elcontech Consulting, Ltd.
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Tamai Terutaka
Elcontech Consulting Ltd.
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IIDA Kazuo
Mie University, Graduate School of Engineering, Vehicle Network Technology Laboratory
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IKEDA Hirosaka
Graduate School of Engineering, Mie University
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SHIMADA Shigeki
Sumitomo Electric Industries, Ltd.
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SAWADA Shigeru
AutoNetworks Technologies, Ltd.
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Ikeda Hirosaka
Graduate School Of Engineering Mie University
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Shimada Shigeki
Sumitomo Electric Industries
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IIDA Kazuo
Mie University
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SAWADA Shigeru
Mie University
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Sato Naoyuki
Mie University Graduate School Of Engineering Vehicle Network Technology Laboratory
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ITO Tetsuya
AutoNetwork Technologies, ltd.
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Sawada Sigeru
AutoNetwork Technologies, ltd.
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Nabeta Yuya
Mie University, Graduate School of Engineering, Laboratory of Vehicle Network Technology Laboratory
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IKEDA Hirosaka
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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Nabeta Yuya
Mie University Graduate School Of Engineering Laboratory Of Vehicle Network Technology Laboratory
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HATTORI Yasuhiro
Basic Technology R&D Department, AutoNetworks Technology, Ltd.
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SHIMIZU Kaori
Circuits and Connection R & D Division, AutoNetworks Technologies, Ltd.
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MASUI Soushi
Graduate School of Engineering, Mie University
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TSUKIJI Shigeki
Graduate School of Engineering, Mie University
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Tsukiji Shigeki
Graduate School Of Engineering Mie University
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Masui Soushi
Graduate School Of Engineering Mie University
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TAMAI Terutaka
Mie University
著作論文
- Frequency Influencing of Fretting Corrosion of Tin Plated Contacts(Session 1 -Fretting-)
- Growth of Oxide Film on the Tin Plated Surface of Connector Contacts and Its effect Contact Resistance Characteristic
- Influence of Fretting Wear on Lifetime of Tin Plated Connectors
- Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
- Micro-structural Study of Fretting Contact caused by the difference of the tin plating thickness(Session 1 -Fretting-)
- Microscopic Observation of Fretting Corrosion of Tin plated Contacts(Session 1 -Fretting-)
- Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot Construction
- Contact Mechanisms and Contact Resistance Characteristics of Solid Tin and Plated Tin Contacts Used for Connectors
- Constriction Resistance Behavior of a Tin or Silver Plated Layer for an Electrical Contact
- Constriction resistance analysis of multi-contact spots
- Contact Area Analysis by FEM with Plating Layer for Electrical Contact
- Contact Mechanisms and Contact Resistance Characteristics of Solid Tin and Plated Tin Contacts
- Prediction of resistance of electric contact with plated layer (1) : Theoretical analyses
- Prediction of resistance of electrical contact with plated layer (2) : Contact area by FEM analysis
- Deformation of Crystal Morphology in Tin Plated Contact Layer caused by Loading
- Current Density Analysis in Contact Area by Using Light Emission Diode Wafer
- Estimation of Contact Resistance of Tin Plated Contacts by Fretting Corrosion
- Deformation of Crystal Morphology in Tin Plated Contact Layer Caused by Loading
- Deformation of Crystal Morphology in Tin Plated Contact Layer Caused by Loading