SAWADA Shigeru | Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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概要
関連著者
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Sawada Shigeru
Mie Univ. Tsu‐shi Jpn
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HATTORI Yasuhiro
AutoNetworks Technologies, Ltd.
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SAWADA Shigeru
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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HATTORI Yasuhiro
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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TAMAI Terutaka
Graduate School of Engineering, Mie University
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Tamai Terutaka
Mie Univ.
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Hattori Yasuhiro
Autonetworks Tech.
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Hattori Yasuhiro
Circuits And Connection R&d Division Autonetworks Technologies Ltd.
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Saitoh Yasushi
Mie University Graduate School Of Engineering Vehicle Network Technology Laboratory
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ITO Tetsuya
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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SAITOH Yasushi
Graduate School of Engineering, Mie University
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IIDA Kazuo
Graduate School of Engineering, Mie University
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Iida Kazuo
Graduate School Of Engineering Mie University
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Ito Tetsuya
Circuits And Connection R&d Division Autonetworks Technologies Ltd.
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Saitoh Yasushi
Graduate School Of Engineering Mie University
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IKEDA Hirosaka
Graduate School of Engineering, Mie University
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Ikeda Hirosaka
Graduate School Of Engineering Mie University
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IKEDA Hirosaka
Circuits and Connection R&D Division, AutoNetworks Technologies, Ltd.
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SHIMIZU Kaori
AutoNetworks Tech.
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SHIMIZU Kaori
Circuits and Connection R & D Division, AutoNetworks Technologies, Ltd.
著作論文
- Influence of Fretting Wear on Lifetime of Tin Plated Connectors
- Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
- Micro-structural Study of Fretting Contact caused by the difference of the tin plating thickness(Session 1 -Fretting-)
- Microscopic Observation of Fretting Corrosion of Tin plated Contacts(Session 1 -Fretting-)
- Prediction of resistance of electric contact with plated layer (1) : Theoretical analyses