Development of an Apparatus for High-Resolution Measurement of Permittivity of Fluids near the Critical Point and Detection of the Critical Anomaly for Supercritical Ethylene
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-11-15
著者
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西川 恵子
千葉大学大学院融合科学研究科
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TOZAKI Ken-ichi
Department of Physics, Faculty of Education, Chiba University
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KUDO Jun
Division of Diversity Science, Graduate School of Science and Technology, Chiba-University
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CHEN Zai-hua
Diversity Science, Graduate School of Science and Technology, Chiba-University
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NISHIKAWA Keiko
Diversity Science, Graduate School of Science and Technology, Chiba-University
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西川 恵子
千葉大学大学院
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西川 恵子
千葉大
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Kudo Jun
Division Of Diversity Science Graduate School Of Science And Technology Chiba-university
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Chen Zai-hua
Diversity Science Graduate School Of Science And Technology Chiba-university
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Tozaki K
Chiba Univ. Chiba Jpn
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Tozaki Ken-ichi
Physics Laboratory Faculty Of Education Chiba University
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Tozaki Ken-ichi
Department Of Physics Faculty Of Education Chiba University
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Namba K
Semiconductor Research Laboratory Mitsubishi Electric Corporation
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Tozaki K
Department Of Physics Faculty Of Education Chiba University
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