Spatially Resolved Imaging of the Spectral Emission Characteristic of an InGaN/GaN-Multi Quantum Well-Light-Emitting Diode by Scanning Electroluminescence Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-04-30
著者
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Christen J
institute of Experimental Physics,Otto-von-Guericke-University Magdeburg
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Christen J
Otto-von‐guericke Univ. Magdeburg Deu
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Christen Jurgen
Institute Of Experimental Physics Otto-von-guericke University
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Kirchner Christoph
Department Of Optoelectronics University Of Ulm
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FISCHER Peter
Institute of Experimental Physics, Otto-von-Guericke University
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ZACHARIAS Margit
Institute of Experimental Physics, Otto-von-Guericke University
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SCHWEGLER Veit
Department of Optoelectronics, University of Ulm
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KAMP Markus
Department of Optoelectronics, University of Ulm
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Fischer Peter
Institute Of Experimental Physics Otto-von-guericke University
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Fischer Peter
Max-plank-institute For Metals Research Heisenbergstrasse
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Kamp M
Univ. Wuerzburg Wuerzburg Deu
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Schwegler Veit
Department Of Optoelectronics University Of Ulm
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Christen Jurgen
Institut Fur Experimentelle Physik Otto-von-guericke Universitat
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Zacharias Margit
Institute Of Experimental Physics Otto-von-guericke University
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