Dry Etching Characteristics of Si-based Materials Using CF_4/O_2 Atmospheric-Pressure Glow Discharge Plasma
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-01-15
著者
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MAKINO Nobuaki
Corporate Manufacturing Engineering Center, Toshiba Corporation
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KANOH Masaaki
Corporate Manufacturing Engineering Center, Toshiba Corporation
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Makino N
Toshiba Corp. Yokohama Jpn
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Makino Nobuaki
Corporate Manufacturing Engineering Center Toshiba Corporation
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KATAOKA Yoshinori
Corporate manufacturing Engineering Center, Toshiba Corporation
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SUZUKI Keiji
Corporate manufacturing Engineering Center, Toshiba Corporation
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SAITOH Shuishi
Corporate manufacturing Engineering Center, Toshiba Corporation
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MIYAJIMA Hiroo
Seiko Epson Corporation
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MORI Yoshiaki
Seiko Epson Corporation
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Kanoh Masaaki
Corporate Manufacturing Engineering Center Toshiba Corporation
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Saitoh Shuishi
Corporate Manufacturing Engineering Center Toshiba Corporation
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Kataoka Yoshinori
Corporate Manufacturing Engineering Center Toshiba Corporation
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Suzuki Keiji
Corporate Manufacturing Engineering Center Toshiba Corporation
関連論文
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- A Theoretical Study on the Realistic Low Concentration Doping in Silicon Semiconductors by Accelerated Quantum Chemical Molecular Dynamics Method
- Quantum Chemical Molecular Dynamics Simulation of the Plasma Etching Processes
- Dry Etching Characteristics of Si-based Materials Using CF_4/O_2 Atmospheric-Pressure Glow Discharge Plasma
- Measurement of Electron Density of Reactive Plasma Using a Plasma Oscillation Method(Nuclear Science, Plasmas, and Electric Discharges)
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- Quantum Chemical Molecular Dynamics Simulation of the Plasma Etching Processes
- A Theoretical Study on the Realistic Low Concentration Doping in Silicon Semiconductors by Accelerated Quantum Chemical Molecular Dynamics Method
- Selective Plasma Surface Modification of Resist for Patterning Hydrophobic and Hydrophilic Regions
- End-point Detection of Reactive Ion Etching by Plasma Impedance Monitoring
- Influence of Oxygen Addition and Wafer Bias Voltage on Bromine Atom Surface Reaction in a HBr/Ar Inductively Coupled Plasma
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