Photoluminescence Analysis of Annealed Silicon Crystals
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1979-07-05
著者
-
Tajima Michio
Electrotechnical Laboratory
-
Iizuka Takashi
Cooperative Laboratories Vlsi Technology Research Association:(present) Electrotechnical Laboratory
-
Kishino Seigo
Cooperative Laboratories Vlsi Technology Research Association:(present Address) Musashi Works Of Hit
-
Kishino Seigo
Cooperative Laboratories Vlsi Technology Research Association:(present) Central Research Laboratory
-
Kishino Seigo
Cooperative Laboratories Vlsi Technology Research Association
-
Iizuka Takashi
Cooperative Laboratories Vlsi Technology Research Association
関連論文
- The Staebler-Wronski Effect on Defect Luminescence in Hydrogenated Amorphous Silicon
- Charge State Density Profiling of EL2 Deep Donor in GaAs Using Selective Excitation Luminescence
- Photoluminescence Analysis of 'New Donors' in Silicon
- Photoluminescence Analysis of Annealed Silicon Crystals
- Photoluminescence Spectra of Thermal Donors in Silicon
- Heavy Metal Gettering by an Intrinsic Gettering Technique Using Microdefects in Czochralski-Grown Silicon Wafers
- A Study on Thermally Induced Microdefects in Czochralski-Grown Silicon Crystals : Dependence on Annealing Temperature and Starting Materials
- The Enhancement of Anomalously Transmitted X-Ray Intensity by Asymmetric Diffraction and Its Application to Si Wafer Evaluation
- Direct Observation of Dislocations in a LEC-GaP Crystal by Light Scattering Method
- Photoluminescence Associated with Nitrogen in Silicon
- Recovery Effect of Deep Level Luminescence Induced by Below Band-Gap Excitation in GaAs
- Characterization of Residual Impurities in Highly Pure Si Crystals by Photoluminescence Technique : C-3: CRYSTAL TECHNOLOGY
- Fatigue and Recovery Effects of the 0.65-eV Emission Band in GaAs
- A New Type of Etch-Pit in an LEC-GaP Crystal
- Characterization of Nonuniformity in Semi-Insulating LEC GaAs by Photoluminescence Spectroscopy
- Mapping of EL2-Related Luminescence on Semi-Insulating GaAs Wafers at Room Temperature : Semiconductors and Semiconductors Devices
- Photoluminescence Analyses of Shallow Impurities in Silicon
- Thermally Induced Microdefects in Czochralski-Grown Silicon : Nucleation and Growth Behavior
- Photoluminescence Analysis of Impurities in Epitaxial Silicon Crystals