Iizuka Takashi | Cooperative Laboratories Vlsi Technology Research Association
スポンサーリンク
概要
関連著者
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Iizuka Takashi
Cooperative Laboratories Vlsi Technology Research Association
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Kishino Seigo
Cooperative Laboratories Vlsi Technology Research Association
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Tajima Michio
Electrotechnical Laboratory
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Iizuka Takashi
Cooperative Laboratories Vlsi Technology Research Association:(present) Electrotechnical Laboratory
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Kishino Seigo
Cooperative Laboratories Vlsi Technology Research Association:(present Address) Musashi Works Of Hit
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Kishino Seigo
Cooperative Laboratories Vlsi Technology Research Association:(present) Central Research Laboratory
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KANAMORI Akihiro
Cooperative Laboratories, VLSI Technology Research Association
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Kanamori Akihiro
Cooperative Laboratories Vlsi Technology Research Association:(present) Hirosaki University
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Yoshihiro Naotsugu
Cooperative Laboratories Vlsi Technology Research Association
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Matsushita Yoshiaki
Cooperative Laboratories Vlsi Technology Research Association
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Kanamori Masaru
Cooperative Laboratories Vlsi Technology Research Association
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NAGASAWA Kazutoshi
Cooperative Laboratories, VLSI Technology Research Association
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Nagasawa Kazutoshi
Cooperative Laboratories Vlsi Technology Research Association
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MATSUSHITA Yoshiaki
Cooperative Laboratories, VLSI Technology Research Association :(Present address) Research & Development Center, Toshiba Co.
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IIZUKA Takashi
Cooperative Laboratories, VLSI Technology Research Association:(Present address) Electrotechnical Laboratory
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KISHINO Seigo
Cooperative Laboratories, VLSI Technology Research Association:(Present address) Musashi Works of Hitachi Ltd.
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KANAMORI Masaru
Cooperative Laboratories, VLSI Technology Research Association:(Present address) Centeral Research Laboratory, Nippon Electric Co., Ltd.
著作論文
- Photoluminescence Analysis of 'New Donors' in Silicon
- Photoluminescence Analysis of Annealed Silicon Crystals
- Photoluminescence Spectra of Thermal Donors in Silicon
- Heavy Metal Gettering by an Intrinsic Gettering Technique Using Microdefects in Czochralski-Grown Silicon Wafers
- The Enhancement of Anomalously Transmitted X-Ray Intensity by Asymmetric Diffraction and Its Application to Si Wafer Evaluation
- Thermally Induced Microdefects in Czochralski-Grown Silicon : Nucleation and Growth Behavior