Selective Silicon Epitaxy Using Reduced Pressure Technique
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概要
- 論文の詳細を見る
Silicon selective epitaxial growth using the SiH_2Cl_2-HCI-H_2 system was successfully accomplished on a window surrounded by fine patterned insulator films as a mask. Surface planarity was obtained at less than 80 Torr reduced pressure. Good selectivity was realized by suitable HCl injection during epitaxial growth. Moreover, it was found that the induced defect density on the epi-layer was less at lower growth temperature.
- 社団法人応用物理学会の論文
- 1982-09-20
著者
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Tsuya Hideki
Fundamental Research Laboratories Nec Corporation
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Tsuya Hideki
Fundamental Research Laboratories
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Kurogi Yukinori
Microelectronics Research Laboratories Nippon Electric Co. Ltd.
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Kurogi Yukinori
Microelectronics Research Laboratories Nec Corporation
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TANNO Kohetsu
Fundamental Research Laboratories
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ENDO Nobuhiro
Microelectronics Research Laboratories, Nippon Electric Co., Ltd.
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KITAJIMA Hiroshi
Fundamental Research Laboratories
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Kitajima H
Forestry And Forest Products Research Institute
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Endo Nobuhiro
Microelectronics Research Laboratories
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Endo Nobuhiro
Microelectronics Research Laboratories Nippon Electric Co. Ltd.
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Tanno Kohetsu
Fundamental Research Laboratories:(present Address) 1st Lsi Division Nec Dorporation Ltd.
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