Surface Structure Analysis of Polycrystalline Zinc by SEELFS and EAPFS
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概要
- 論文の詳細を見る
From the view point of comparing SEELFS with EAPFS, we tried to measure the fine structure above the Zn-M_<2, 3> threshold of polycrystalline zinc. From the result of SEELFS, we were able to obtain a nearest-neighbour atomic spacing of 0.242 nm. In EAPFS, we obtained the nearest-neighbour atomic spacings of 0.241 (l=2), 0.251 (l=1) and 0.261 nm (l=0). The result of EAPFS agrees well with that of SEELFS when we assume a final state of l=2, in spite of a lack of dipole selection rules.
- 社団法人応用物理学会の論文
- 1989-06-20
著者
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KONISHI Ryosuke
Department of Electrical and Electronic Engineering, Faculty of Engineering, Tottori University
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Sasakura Hiroshi
Department Of Electrical Engineering And Electronics Faculty Of Engineering Tottori Univeristy
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Sasakura H
Department Of Materials Science University Of Osaka Prefecture
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Arioka Masato
Department Of Electronics Faculty Of Engineering Tottori University
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Konishi R
Tottori Univ. Tottori
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Konishi Ryosuke
Department Of Electrical And Electronic Engineering Tottori University
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