Reduction of Mobile Pt Ion Density in SiO_2 and Si-SiO_2 Interface State Density in Pt-diffused Metal-Oxide-Semiconductor Structures

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Effects of Platinum Diffusion on MOS System
Annealing Behavior of Defects Induced by Self-Implantation in Si
Damage and Its Rapid Thermal Annealing Behavior of 1 MeV Ar^+-Ion-Implanted Silicon
Reduction of Mobile Pt Ion Density in SiO_2 and Si-SiO_2 Interface State Density in Pt-diffused Metal-Oxide-Semiconductor Structures
Improvement of Electrical Characteristics of Pt-Diffused Devices
Surface Effects on Leakage Current and Lifetime in Pt Diffused Planar Silicon p^+n Diodes
Effects of Various Hydrogenation Processes on Bias-Stress-Induced Degradation in p-Channel Polysilicon Thin Film Transistors
Mechanisms of Electrical Stress-Induced Degradation in H_2/Plasma Hydrogenated n- and p-Channel Polysilicon Thin Film Transistors
Platinum as Recombination-Generation Centers in Silicon
Dose Dependence of Recrystallization Behavior in Germanium-Ion-Implanted Polycrystalline Silicon Films
Control of Resistivity of Polycrystalline Si Films by Solid-Phase Recrystallization (SPR) : Semiconductors and Semiconductor Devices
Reduction of Leakage Current and Minority Carrier Lifetime in Platinum-Diffused pn Diodes
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Oscillation in Semiconductors with a Dumbbell-Shaped Structure
Determination of the Energy Distribution of Grain Boundary Traps in Polycrystalline Silicon Films

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