Kuwano Hiroshi | Faculty Of Science And Technology Keio University

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概要

• 同名の論文著者
• Faculty Of Science And Technology Keio Universityの論文著者

関連著者

• Kuwano Hiroshi

  Faculty Of Science And Technology Keio University

• KUWANO Hiroshi

  Faculty of Science and Technology, Keio University

• Kuwano H

  Department Of Electrical Engineering Faculty Of Science And Technology Kejo Unitersity

• Shu Chang

  Faculty Of Science And Technology Keio University

• Deng Bei

  Faculty Of Science And Technology Keio University

• Kim Kwang

  Faculty Of Science And Technology Keio University

• Hahn Soo

  Department Of Materials Science And Engineering Stanford University

• Kwon Young

  Semiconductor Research Laboratory Research Institute Of Industrial Science & Technology

• DENG Bei

  Faculty of Science and Technology, Keio University

• SAGALA Pahlawan

  Faculty of Science and Technology, Keio University

• Deng B

  Faculty Of Science And Technology Keio University

• Sagala Pahlawan

  Faculty Of Science And Technology Keio University

• KATO Hideo

  Faculty of Engineering Chiba University

• Mizushima Ichiro

  Faculty Of Science And Technology Keio University

• Mori Seiichi

  Faculty Of Science And Technology Keio University

• Endo Katsumi

  Faculty Of Science And Technology Keio University

• Matsui Takayuki

  Faculty Of Science And Technology Keio University

• KANG Myeon-Koo

  Faculty of Science and Technology, Keio University

• TABUCHI Wataru

  Faculty of Science and Technology, Keio University

• Kang Myeon-koo

  Faculty Of Science And Technology Keio University

• Kato Hideo

  Faculty Of Science And Technology Keio University

• Tabuchi Wataru

  Faculty Of Science And Technology Keio University

• INTO Jun-ichi

  Faculty of Science and Technology, Keio University

• Into Jun-ichi

  Faculty Of Science And Technology Keio University

• SHU Chang

  Faculty of Science and Technology, Keio University

• YAMAMOTO Ichiro

  Faculty of Science and Technology, Keio University

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著作論文

• Effects of Platinum Diffusion on MOS System
• Annealing Behavior of Defects Induced by Self-Implantation in Si
• Damage and Its Rapid Thermal Annealing Behavior of 1 MeV Ar^+-Ion-Implanted Silicon
• Reduction of Mobile Pt Ion Density in SiO_2 and Si-SiO_2 Interface State Density in Pt-diffused Metal-Oxide-Semiconductor Structures
• Improvement of Electrical Characteristics of Pt-Diffused Devices
• Surface Effects on Leakage Current and Lifetime in Pt Diffused Planar Silicon p^+n Diodes
• Platinum as Recombination-Generation Centers in Silicon
• Dose Dependence of Recrystallization Behavior in Germanium-Ion-Implanted Polycrystalline Silicon Films
• Control of Resistivity of Polycrystalline Si Films by Solid-Phase Recrystallization (SPR) : Semiconductors and Semiconductor Devices
• Reduction of Leakage Current and Minority Carrier Lifetime in Platinum-Diffused pn Diodes
• Oscillation in Semiconductors with a Dumbbell-Shaped Structure
• Determination of the Energy Distribution of Grain Boundary Traps in Polycrystalline Silicon Films

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