Simulation of Atomic Force Microscopy Image Variations along the Surface Normal:Presence of Possible Resolution Limit in the Attractive Force Range

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概要

• 論文の詳細を見る

• Variations of atomic force microscopy (AFM) images as tip-sample distance is varied were examined using a newly developed AFM simulation code ACCESS (AFM simulation Code for Calculating and Evaluating Surface structures) with a Morse-type pairwise potential. A model system consisting of a single atom tip (an "ideal" AFM tip) and a face-centered cubic (fcc) (100) surface with or without point defect showed perfect atomic resolution when scanning was performed in the repulsive force range. In the attractive force range, image contrast inversion was observed twice with the increase of tip-sample distance. Simulation on the point defect surface indicated that this inversion is due to a collective force from more than one atom being imaged as one bright spot. Exact correspondence between the sample surface registry and the simulated image in this force range appears to be coincidental.

• 社団法人応用物理学会の論文
• 1995-06-15

著者

• Miyamoto A

  New Ind. Creation Hatchery Center Tohoku Univ.

• MIYAMOTO Akira

  Department of Applied Chemistry, Graduate School of Engineering, Tohoku University

• 小宮山 政晴

  山梨大学 大学院 医学工学総合研究部

• KOMIYAMA Masaharu

  Department of Chemistry, Yamanashi University

• Kubo Momoji

  Department Of Molecular Chemistry And Engineering Tohoku University

• Kubo Momoji

  Department Of Applied Chemistry Graduate School Of Engineering Tohoku University

• OHKUBO Satoshi

  Fujitsu Laboratories Ltd.

• Komiyama Masaharu

  Department Of Chemistry Yamanashi University

• Miyamoto Akira

  Department Of Applied Chemistry Graduate School Of Engineering Tohoku University

• Ohkubo Shuichi

  Ulsi Technology Laboratory Fujitsu Laboratories Ltd.

• TAZAWA Katsuyuki

  Department of Molecular Chemistry and Engineering, Faculty of Engineering, Tohoku University

• TSUJIMICHI kazuya

  Department of Molecular Chemistry and Engineering, Faculty of Engineering, Tohoku University

• Tazawa Katsuyuki

  Department Of Molecular Chemistry And Engineering Tohoku University

• Tsujimichi Kazuya

  Department Of Molecular Chemistry And Engineering Tohoku University

• Komiyama Masaharu

  Department Of Chemistry Faculty Of Liberal Arts And Education Yamanashi University

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