Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface

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Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface
Dependence of Grown-in Defect Behavior on Oxygen Concentration in Czoehralski Silicon Crystals
Formation of Grown-in Defects during Czochralski Silicon Crystal Growth
A Method of Quantitative Contamination with Metallic Impurities of the Surface of a Silicon Wafer : Semiconductors and Semiconductor Devices
Influence of Metal Impurities on Leakage Current of Si N^+ P Diode
Dependence of Gettering Efficiency on Metal Impurities
TEM Observation of Defects Induced by Ni Contamination on a Si(100) Surface
Comparison of Gettering Techniques by Means of Intentional Quantitative Cu Contamination : Electrical Properties of Condensed Matter
A Model of Thermal Transfer in Czochralski Silicon Molten
Dependence of the Grown-in Defect Distribution on Growth Rates in Czochralski Silicon
TEM Observation of Defects Induced by Cu Contamination on Si(100) Surface : Condensed Matter
Axial Microscopic Distribution of Grown-in Defects in Czochralski-Grown Silicon Crystals
Degradation of Gate Oxide Integrity by Metal Impurities
Behavior of Defects Induced by Metallic Impurities on Si(100) Surfaces

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