Fujino N | Kyushu Electronic Metal Corp.
スポンサーリンク
概要
関連著者
-
Fujino N
Kyushu Electronic Metal Corp.
-
FUJINO Nobukatsu
Kyushu Electronic Metal Co., Ltd
-
SUMITA Shigeo
Kyushu Electronic Metal Co., Ltd
-
SHIRAIWA Toshio
Osaka Titanium Co., Ltd
-
Sumita Shigeo
Kyushu Electronic Metal Co. Ltd
-
Shiraiwa Toshio
Osaka Titanium Co. Ltd
-
Sano M
Sumitomo Metal Ind. Ltd. Saga Jpn
-
HOURAI Masataka
Kyushu Electronic Metal Co., Ltd
-
Sumita Shigeo
Silicon Technology Center Sumitomo Sitix Corporation
-
Sadamitsu S
Sumitomo Sitix Corp. Saga Jpn
-
Hourai M
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
-
Miyazaki M
Silicon Technology R&d Center Sumitomo Sitix Corporation
-
Sasaki Ayako
Kyushu Electronic Metal Co. Ltd
-
SADAMITSU Shinsuke
Kyushu Electronic Metal Co., Ltd
-
YAMASHITA Kenichi
Kyushu University
-
Yamashita Kenichi
Kyushu Electronic Metal Corp.
-
Oka Yasunori
Kyushu Electronic Metal Co. Ltd
-
Aoki Toshihiko
Kyushu Electronic Metal Corp.
-
NARIDOMI Toshio
Kyushu Electronic Metal Co., Ltd
-
MURAKAMI Katsumi
Kyushu Electronic Metal Co., Ltd
-
Miyazaki Morimasa
Kyushu Electronic Metal Co., Ltd
-
Sano Masakazu
Kyushu Electronic Metal Co., Ltd
-
SANO Masakazu
Kyusyu Electronic Metal Co., Ltd,
-
HORAI Masataka
Kyusyu Electronic Metal Co., Ltd,
-
MIYAZAKI Morimasa
Kyusyu Electronic Metal Co., Ltd,
-
FUJINO Nobukatsu
Kyusyu Electronic Metal Co., Ltd,
-
Murakami Katsumi
Kyushu Electronic Metal Co. Ltd
-
KITAGAWA Kunihiko
Kyushu Electronic Metal Corp.
-
KAJITA Eiji
Kyushu Electronic Metal Corp.
-
Shiraiwa T
Department Of Physical Electronics Tokyo Institute Of Technology
-
Horai Masataka
Kyusyu Electronic Metal Co. Ltd
-
Naridomi Toshio
Kyushu Electronic Metal Co. Ltd
-
Sadamitsu Shinsuke
Kyushu Electronic Metal Co. Ltd
著作論文
- Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface
- A Method of Quantitative Contamination with Metallic Impurities of the Surface of a Silicon Wafer : Semiconductors and Semiconductor Devices
- Influence of Metal Impurities on Leakage Current of Si N^+ P Diode
- Comparison of Gettering Techniques by Means of Intentional Quantitative Cu Contamination : Electrical Properties of Condensed Matter
- A Model of Thermal Transfer in Czochralski Silicon Molten