FUJINO Nobukatsu | Kyushu Electronic Metal Co., Ltd
スポンサーリンク
概要
関連著者
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FUJINO Nobukatsu
Kyushu Electronic Metal Co., Ltd
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SUMITA Shigeo
Kyushu Electronic Metal Co., Ltd
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Sumita Shigeo
Kyushu Electronic Metal Co. Ltd
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Shiraiwa Toshio
Osaka Titanium Co. Ltd
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HOURAI Masataka
Kyushu Electronic Metal Co., Ltd
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SHIRAIWA Toshio
Osaka Titanium Co., Ltd
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Sano Masakazu
Kyushu Electronic Metal Co., Ltd
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Fujino N
Kyushu Electronic Metal Corp.
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Sadamitsu Shinsuke
Kyushu Electronic Metal Co. Ltd
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Sano M
Sumitomo Metal Ind. Ltd. Saga Jpn
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SADAMITSU Shinsuke
Kyushu Electronic Metal Co., Ltd
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Sumita Shigeo
Silicon Technology Center Sumitomo Sitix Corporation
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Sadamitsu S
Sumitomo Sitix Corp. Saga Jpn
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Miyazaki Morimasa
Kyushu Electronic Metal Co., Ltd
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Murakami Katsumi
Kyushu Electronic Metal Co. Ltd
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Hourai M
Research And Development Center Sitix Division Sumitomo Metal Industries Ltd.
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Sasaki Ayako
Kyushu Electronic Metal Co. Ltd
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YAMASHITA Kenichi
Kyushu University
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Yamashita Kenichi
Kyushu Electronic Metal Corp.
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Oka Yasunori
Kyushu Electronic Metal Co. Ltd
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Aoki Toshihiko
Kyushu Electronic Metal Corp.
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Hiramoto Kazuo
Kyushu Electronic Metal Co. Ltd
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NARIDOMI Toshio
Kyushu Electronic Metal Co., Ltd
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MURAKAMI Katsumi
Kyushu Electronic Metal Co., Ltd
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KITAGAWA Kunihiko
Kyushu Electronic Metal Corp.
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KAJITA Eiji
Kyushu Electronic Metal Corp.
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Shiraiwa T
Department Of Physical Electronics Tokyo Institute Of Technology
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Naridomi Toshio
Kyushu Electronic Metal Co. Ltd
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Miyazaki M
Silicon Technology R&d Center Sumitomo Sitix Corporation
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HIRAMOTO Kazuo
Kyushu Electronic Metal Co., Ltd
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Murakami Katsumi
Kyushu Electronic Metal Co., Ltd, Kouhoku, Kishima-Gun, Saga 849-05
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Shigematsu Tatsuhiko
Kyushu Electronic Metal Co., Ltd, Kouhoku, Kishima-Gun, Saga 849-05
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Fujino Nobukatsu
Kyushu Electronic Metal Co., Ltd, Kouhoku, Kishima-Gun, Saga 849-05
著作論文
- Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface
- A Method of Quantitative Contamination with Metallic Impurities of the Surface of a Silicon Wafer : Semiconductors and Semiconductor Devices
- Influence of Metal Impurities on Leakage Current of Si N^+ P Diode
- Dependence of Gettering Efficiency on Metal Impurities
- TEM Observation of Defects Induced by Ni Contamination on a Si(100) Surface
- A Model of Thermal Transfer in Czochralski Silicon Molten
- Degradation of Gate Oxide Integrity by Metal Impurities
- Behavior of Defects Induced by Metallic Impurities on Si(100) Surfaces