GaAs Surface Cleaning/Etching Using Plasma-Dissociated Cl Radical
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-12-15
著者
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Sugimoto Yoshimasa
Opto-Electronics Research Laboratories, NEC Corporation
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Asakawa Kiyoshi
Opto-Electronics Research Laboratories, NEC Corporation
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KOHMOTO Shigeru
Tsukuba Laboratory, The Femtosecond Technology Research Association
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Ide Yuichi
Opto-electronics Research Laboratories Nec Corporation
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Kohmoto S
Femtosecond Technol. Res. Assoc. (festa) Tsukuba Jpn
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Asakawa K
Center For Tsukuba Advanced Research Alliance (tara) University Of Tsukuba
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KOHMOTO Shigeru
Opto-Electronics Research Laboratories, NEC Corporation
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Sugimoto Y
Department Of Research And Development Nichia Chemical Industries Ltd
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Sugimoto Yoshimasa
Opto-electronics Research Laboratories Nec Corporation
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Asakawa K
Femtosecond Technol. Res. Assoc. (festa) Tsukuba Jpn
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Asakawa Kiyoshi
Opto-electronics Research Laboratories Nippon Electric Co. Ltd.
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