Secondary Electron Emission Type Neutral Particle Detector

概要

論文の詳細を見る
Experimental studies have been made on the secondary electron emission yields from metal surfaces bombarded by H_<1^0>, H_<1^+>, and H_<2^0> with energies ranging by 10 to 40 KeV. The yields increase with the incident beam energy. The yield from H_<1^0> is smaller than that by H_<1^+> and is proportional to the cosecant of the incidence angle. The yield by H_<2^0> is larger by a factor of two than that by H_<1^0> with the same velocity. The mechanism of the secondary electron emission is discussed by comparing the yield by H_<1^0> with that by H_<1^+> and by considering the observed angular dependence. The observed difference in the yields by H_<1^0> and H_<1^+> is considered to originate essentially from the difference between the ionization cross-sections of the two particles within the shallow layer below the surface. A neutral particle detector has been made on the basis of the angular dependence results.
社団法人応用物理学会の論文
1966-06-15