NiFeCo/Cu/Co System for Magnetoresistive Random Access Memory (MRAM)
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概要
- 論文の詳細を見る
Memory characteristics of NiFeCo/Cu/Co system deposited on 4°tilt-cut Si (111) substratc have been investigated. With a Cu (50A) underlayer on 4° tilt-cut Si (111) substrate, NiFeCo/Cu/Co multilayers developed in-plane uniaxial magnetic anisotropy and they showed perfectly square R-H curves, which represent the possibility of a MRAM application. In large scale test MRAM cells consisting of [NiFeCo (60A)/Cu (40A)/Co (30A)/Cu (40A)]_5 multilayers, 400 μV voltage difference between the two magnetoresistive states was obtained with 2 A of word current at 1 mA of fixed sense current, which has been believed to show high potentials of NiFeCo/Cu/Co system in a MRAM application
- 社団法人映像情報メディア学会の論文
- 1996-11-22
著者
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Kim H‐j
Seoul National Univ. Seoul Kor
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Lee B‐i
Seoul National Univ. Seoul Kor
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Lee Byung-ll
Division of Materials Science and Engineering Seoul National University
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Joo Seung-Ki
Division of Materials Science and Engineering Seoul National University
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Joo S‐k
Seoul National Univ. Seoul Kor
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Joo Seung-ki
School Of Material Science And Engineering Seoul-national University
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Joo Seung-ki
Division Of Materials Science And Engineering College Of Engineering Seoul National University
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Joo Seung-ki
Division Of Materials Science And Engineering Seoul National Univ.
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Kim Hyeong-Jun
School of Materials Science and Engineering , Seoul National University
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Kim Hyeong-Jun
Division of Materials Science and Engineering Seoul National University
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Kim Hyeong-jun
School Of Materials Science And Engineering Seoul National University
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Lee B‐i
School Of Material Science And Engineering Seoul-national University
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Joo Seung-ki
Division Of Materials Science Ancl Engineering College Of Engineering Seoul National University
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