Statistical Modeling of Device Characteristics with Systematic Variability(Special Section on Analog Circuit Techniques Supporting the System LSI Era)
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概要
- 論文の詳細を見る
The variabilities of device characteristics are usually regarded as a normal distribution. If we consider the variabilities over the whole wafer, however, they cannot be expressed as a normal distribution due to the existence of global systematic component. We propose a statistical model, characterizing the global systematic component according to the distance from the center of the wafer, which can express the variabilities over the whole wafer statistically.
- 社団法人電子情報通信学会の論文
- 2001-02-01
著者
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OKADA Kenichi
the Department of Communications and Computer Engineering, Kyoto University
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ONODERA Hidetoshi
the Department of Communications and Computer Engineering, Kyoto University
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Onodera Hidetoshi
The Department Of Communications And Computer Engineering Kyoto University
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Okada Kenichi
The Department Of Communications And Computer Engineering Kyoto University
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Onodera Hidetoshi
The Department Of Communications And Computer Engineering Graduate School Of Informatics Kyoto Unive
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