Design and Application of Ferroelectric Memory Based Nonvolatile SRAM(<Special Section>New System Paradigms for Integrated Electronics)
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概要
- 論文の詳細を見る
Circuit techniques to realize stable recall operation and virtually unlimited read/program cycle operations in ferroelectric memory based nonvolatile (NV) SRAM composed of six-transistor and four-ferroelectric capacitor cells have been developed. Unlimited program cycle operation independent of ferroelectric material characteristics is realized by proper control of plate lines. Reliability evaluation results show that the developed memory cell has sufficient operation margin after stresses of temperature, fatigue, DC bias. Application of NV-SRAM to programmable logic devices has been discussed with a prototype of dynamically programmable gate arrays.
- 社団法人電子情報通信学会の論文
- 2004-11-01
著者
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HONDA Koichiro
Fujitsu Laboratories Ltd.
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Honda Koichiro
Fujitsu Lab. Ltd. Kanagawa Jpn
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Honda K
Fujitsu Laboratories Ltd.
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Masui Shoichi
Fujitsu Laboratories Ltd.
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Ohkawa Takashi
Fujitsu Ltd.
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Horii Y
Fujitsu Lab. Ltd. Kanagawa Jpn
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Horii Yoshimasa
Fujitsu Limited
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Horii Yoshimasa
Fujitsu Laboratory Ltd.
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Horii Yoshimasa
Fujitsu Ltd.
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NINOMIYA Tsuzumi
Fujitsu Ltd.
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OURA Michiya
Fujitsu Ltd.
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KIN Nobuhiro
Fujitsu Laboratories, Ltd.
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Ninomiya T
Fujitsu Ltd.
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Kin Nobuhiro
Fujitsu Laboratories Ltd.
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HONDA Koichiro
Fujitsu Laboratories, Ltd.
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