FRPの環境による劣化の評価へのX線分析顕微鏡の適用

概要

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An X-ray analytical microscope (XAM) has been applied to evaluate environmental degradation of FRP. In the XAM examination, a parallel beam geometry has been used with a 10 micrometer and a 100 micrometer diameter X-ray guide tube and a high-purity silicon X-ray detector. The X-Y scanning stage, which has a 100 mm of travel distance, allows us to examine samples in the air. Therefore large sections or several samples can be examined simultaneously. Using the XAM, the area of interest can be analyzed and the compositional image of the sample is obtained. The sample is FRP immersed in an acid solution. The penetration of the acid into the sample was analyzed after the immersion by the XAM. It has been indicated that the XAM technique is particularly useful for the analysis of the elemental distribution in an organic matrix such as FRP.
2002-12-25