ラマン分光法による多結晶アルミナの三次元結晶方位の測定

概要

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A method for determining crystallographic orientation in alumina grains was developed using a polarized Raman spectroscopy. The experimental setup is similar to the typical Raman microprobe system, but it is capable of rotating the sample and equipped with a pinhole plate to achieving high resolution along the surface. In order to determine the Al_2O_3 crystallite orientation, intensities of Raman scattering in the modes of face. In order to determine the Al_2O_3 crystallite orientation, intensities of Raman scattering in the modes of E_g and A_<1g> were measured as a function of rotational angle. The measured intensities of polarized scattering lines in the E_g and A_<1g> modes were fitted with a theoretical function to determine the three-dimensional c-axis orientation of the grains. Suitable Raman scattering lines of alumina appeared at 378 and 645 cm^<-1> which correspond to the E_g and A_<1g> modes, respectively. In order to calculate theoretical intensities from Raman tensors, the Raman intensities were measured in a sapphire crystal, in which the crystallographic orientation was known. The present method was successfully applied to small crystal grains appearing on the surface of polycrystalline alumina.
社団法人日本セラミックス協会の論文
2001-01-01