ラマン分光法による多結晶アルミナの結晶方位の測定

概要

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A method for measuring the crystallographic orientation of individual grains in polycrystalline alumina was developed using Raman micro-spectroscopy. The relationship between the intensity of the polarized Raman scattering at 645 cm^<-1> line, which belongs to A_<1g> mode, and the crystallographic orientation was analyzed and a simple theoretical equation was obtained. Raman scattering intensities, which were measured as a function of the rotation angle of the specimen, were compared with values calculated from the newly proposed theoretical equation. Raman tensor elements, a and b, of the A_<1g> mode were determined to be a≪b from measurements on sapphire crystal. The crystal orientation evaluation method was applied to a thin translucent alumina plate, and the projections of the c-axis orientation of crystallites on a plane of polish were successfully determined.
社団法人日本セラミックス協会の論文
2000-10-01