符号化格子線投影による高さ測定とビンピッキング

概要

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For the sake of bin-picking, usually three-dimensional recognition is applied. However, this method uses complex recognition procedure that needs much computing time, and the probability of successful recognition is not sufficiently high. In our research, first the position of the part having maximum height is detected using coded lattice pattern, and then two-dimensional recognition is made in the neighborhood of the highest point. By this way the minimum necessary data for bin-picking are obtained. The active slit pattern is used only for detecting the highest location instead of obtaining three-dimensional image in the conventional method. The lattice slits are coded by changing the combination of the thickness of lines. By using this visual method together with the versatile vacuum chuck, We obtained successful result of electrolysis capacitors bin-picking.
社団法人精密工学会の論文
1998-01-05